Automotive Components Engineering
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Measuring Devices & Methods
- indication measurement equipment Indimicro 602 AVL
- laser (UV, VIS, IR) for optical diagnostics
- Zeiss Laser-Scanning-Microscope LSM900
- LPKF ProtoLaser R4
- cameras (CCD, high-speed, IR)
- spectroscopical methods (LIF, Raman, Rayleigh, Mie, CLD, NDIR, FID, FTIR)
- particle image velocimetry (PIV)
- DMS 500
- scanning mobility particle sizing (SMPS)
- chromatography (HPLC, GC with FID/PFPD/MS)
- S and N analysis up to < 1 ppm
- scanning electron microscope (including BSE and EDX, ESEM)
- thermogravimetry
- digital oscillography, network and spectra analysis (up to GHz range)
- ICP-OES / XRD
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